Nearfield Instruments develops and supplies metrology equipment used for process control in the semiconductor manufacturing industry. The company designs, integrates, and services advanced measurement systems that help chipmakers monitor and improve production processes. Its technology is based on high-throughput scanning probe microscopy and includes solutions for non-destructive measurement of complex three-dimensional semiconductor structures. Nearfield Instruments also conducts research and development in precision mechatronics, motion control, vibration isolation, and automated probe handling to enhance measurement accuracy and productivity. The company works closely with customers and research partners to address metrology challenges associated with increasingly miniaturized and complex semiconductor devices.